JAEA
  • help
  • PC | SP
  • JP | EN
          
Refine your search：     
Report No.
 - 
Clear All
Search Results: Records 1-4 displayed on this page of 4
  • 1

Presentation/Publication Type

Initialising ...

Refine

Journal/Book Title

Initialising ...

Meeting title

Initialising ...

First Author

Initialising ...

Keyword

Initialising ...

Language

Initialising ...

Publication Year

Initialising ...

Held year of conference

Initialising ...

Save select records

Journal Articles

In-situ observation of the damage evolution in $$beta$$-SiC crystals during helium and hydrogen dual-ion irradiations

Hojo, Kiichi; Furuno, Shigemi; Kushita, Kohei; ; *

Nuclear Instruments and Methods in Physics Research B, 91, p.534 - 539, 1994/00

https://doi.org/10.1016/0168-583X(94)96281-2
 Times Cited Count：6 Percentile：57.15(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Dual ion beam irradiation system for in situ observation with electron microscope

*; Hojo, Kiichi; Furuno, Shigemi; ; *

Shinku, 36(7), p.603 - 609, 1993/00

https://doi.org/10.3131/jvsj.36.603

no abstracts in English

Journal Articles

In-situ observation of structural changes in aluminum during He$$^{+}$$ and H$$_{2+}$$ dual-ion beam irradiation

Furuno, Shigemi; Hojo, Kiichi; *; *; Ono, K.*; Kino, Takao*

Journal of Nuclear Materials, 191-194, p.1219 - 1223, 1992/00

https://doi.org/10.1016/0022-3115(92)90668-B
 Times Cited Count：2 Percentile：27.46(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

A New system for in-situ observation of dynamic process of structural and chemical changes during dual ion irradiation in a 400kV electron microscope

Furuno, Shigemi; Hojo, Kiichi; ; *; Sasaki, Teikichi; *; *

Electron Microscopy 1990,Vol. 4, p.538 - 539, 1990/00

no abstracts in English

4 (Records 1-4 displayed on this page)
  • 1